Replacement feeder springs for Mydata Agilis feeders are available for repairing damaged feeders for 8 - 3.7; 8 - 4.0; 8 - 4.7, and 12 - 8.5. Range is compatible with the following machine types: TP9-1, TP9-2, TP9-3, TP9-4, TP11, TP12, TP18, MY9, MY12, MY15, MY19 and MY100 (SX/DX).

Count On Tools, www.cotinc.com

DB-1541-S3 conductive stringer attach adhesive is for use in thin-film, organic and thinned silicon solar modules. Has excellent conductivity and stability on molybdenum substrates. Has more than 12% lower silver loading than DB-1541-S series. Maintains rheology for dispensing, damp heat resistance and conductivity stability on tin, tin-silver and silver-plated ribbons. Has lower volume resistivity than DB-1541-S. Features rubber-like flexibility; ideal for flexible photovoltaic applications with high peel strength.

Engineered Conductive Materials, www.conductives.com

SX stereo zoom microscopes for printed circuit board inspections are designed with fine optics. Permit range of magnification, including SX25, SX45, SX80 and SX100. Basic-level SX-25 binocular microscope has a standard magnifying range of about 10x-45x, with a focusing distance ranging from 97mm to 180mm. Is suitable for flat area imaging and high-res images. SX45 Greenough stereo microscope has a focusing distance of 115mm up to 220mm. Has a standard magnifying range of 8x-50x. SX45 trinocular microscope is equipped with a head option that can be fixed to a video or digital camera. Has a standard magnification range of about 8x-64x. Has a standard focusing distance of 78mm up to 130mm. SX100 trinocular microscope has a standard magnification range of 8x-80x, with a focusing distance of up to 78mm to 130mm. The last two have a photo tube option; can be fixed to a video or digital camera.

Vision Engineering, www.visioneng.com

VK-X series 3D laser scanning microscope has a 0.5 nm Z-axis resolution with a magnification range spanning 200x - 24,000x. Has an AI-Scan function to image and measure a target. Includes high-res color imaging and nm-level profile measurement functions. A short-wavelength laser scans across a target to provide non-contact profile, roughness and thickness measurements, including on targets with angular surfaces. Combines laser with 16-bit photomultiplier; reportedly can obtain an image and measurement on nearly any type of material, as well as thickness measurements on transparent films and coatings. Features include a WIDE-Scan function and a high-speed auto-focus algorithm. Images can be captured at up to 21.6 mp.

Keyence, www.digitalmicroscope.com/PRVKX