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YESTraX barcode traceability software enables traceability from AOI systems to the offline review/rework station. Can create a serialized barcode that can be assigned to rework images as well as SPC data. The SPC software will generate quality reports, archive data and improve quality control.
 
The increased need for a paperless environment and lean manufacturing, YESTraX is the first software to provide a barcode traceability function for the AOI market. 
 
Logs board defects, generates barcodes for boards that do not already have one and creates quality control reports, reducing the time to log defects and create reports downloadable to various different software applications.
 
 
YESTech, yestechinc.com
 

OptiCon AdvancedLine is a new hardware platform for AOI that guarantees high fault coverage. The centerpiece of the new family is a modularly extendable camera that allows alternative selection between a one and four mega-pixel camera module. Users can add additional camera options for THT components, color inspection or 3-D measurement as well as angled view inspection for the inspection of J-Lead pins at PLCC and SOJ components.
 
Designed to offer higher test speed, reduced debug times, minimal false call rate and high fault coverage. The platform has an all new appearance and space for further options and capability.
 
The four mega-pixel camera with system-specific telecentric lens allows an inspection field of 40 X 40 mm at a 21 µm resolution. TOP lighting provides  multicoloured LED illumination with three basic colors controllable separately. Quattro illumination with 16 illumination settings enables the display of shorts, laser labelling and polarity markings.
 
GÖPEL electronic GmbH, www.goepel.comww.goepel.com

FrameScan FX is an advanced vectorless test tool for detecting open pins on components and connectors assembled onto PCBs. Uses an enhanced in-circuit capacitive coupling technique that tests for open pins by applying an AC signal to an un-powered PCB node and measuring the voltage coupled to a plate positioned in close proximity to the component or connector being tested. Users can reportedly detect open pins more accurately and with greater repeatability.
 
The complete hardware and software suite can extend measurement capabilities. Solves test issues associated with smaller device packages and connector technologies.  Hardware improvements include a new low-noise op amp that increases the front-end gain of the active probe to minimize the effects of noise upon other stages of the measurement circuit.  Software improvements include an automatic Precision Mode that increases the number of measurement samples for low measurement signals. 
 
Teradyne, www.teradyne.com

 

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