Products
CMS-S1 thermal transfer printer combines terminal block marking, wire marking and equipment marking in one printer. The new, modern design includes a cutter and easy access to the ink ribbon and marking material.
ZBFT markers are usd in the printer for terminal block marking, offering high print quality and a scratch resistant surface.
A variety of wire marking labels including CMT markers, self-laminating stickers and shrink sleeves are also available. For equipment marking, an extensive range of sizes and colors are available.
Phoenix Contact Inc., www.phoenixcon.com
EUV-700 in-line, conveyorized UV curing station incorporates Fusion F300 version "D" lamps. Has a standard focal distance of 2.1" above the product, which produces a 1" wide curing zone. To accommodate component heights, the lamp housings may be indexed in the z direction (2.1 to 5") to prevent the possibility of overexposure for taller components. Each 6" long UV section is selectable through the system's Touch Screen. This energy saving feature allows operators to only turn on and use the desired width range needed. Selectable width ranges are 6, 12 and 18".
Equipped with safety side doors and multi-stage in-line conveyor integrated into special touch panel controls. Operators can set desired cure times through a variable speed drive located in the center section of the station under the UV lamps. Product transfers on 3 mm edge contact to fit a wide range of applications.
Promation, www.Pro-mation-Inc.com
S510 Semiconductor Reliability Test System is a high channel count, turnkey solution for reliability testing and lifetime modeling of ULSI CMOS processes at the 65 nm node and beyond. Said to provide a high degree of wafer-level reliability (WLR) test throughput and flexibility, reducing the time to assess reliability and to perform lifetime modeling. Can also be used for production WLR monitoring or as a lab parametric test system.
The fully automated, multi-channel parallel reliability test system features scalable channel counts from 20 to 72 channels, an independent stress/measure channel for each structure and simultaneous measurement across all channels. Can test multiple devices simultaneously on a wafer in conjunction with a semi-automatic or fully automatic probe station.
Keithley Instruments, www.keithley.com
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