AI-driven probe inspection system automates ICT fixture verification in electronics manufacturing. The system uses high-resolution imaging, synchronized lighting and adaptive AI to analyze probe marks across the PCB, verifying contact accuracy and detecting misalignment, insufficient contact and early probe wear. Supports high-density and fine-pitch designs with approximately 7µm resolution and offers single-sided and dual-sided inspection. Generates detailed inspection reports with probe position data, deviation analysis and visual records to support traceability and process control. Available in automated, benchtop and service-based configurations for production, validation and development environments.