Products
JTAG chain debugger helps reduce debug and test times for engineers designing and testing complex PCBs. Features a range of debug options which allow designers to trace signals around the board and immediately find the location of any problems within the JTAG chain. Engineers can get boards up and running quickly, rapidly diagnose faults and speed up the development process.
“With the addition of the chain debugger to the XJTAG system, engineers now have an ‘out-of-the-box’ solution for debugging and testing boards populated with JTAG devices,” said Dominic Plunkett, CTO. “Design engineers can now debug and test their printed circuits in hours as opposed to days/weeks with other competitive systems.”
In addition to the chain debugger, the XJTAG Development System has other new features to speed up board design and prototype testing. The connection test now includes built-in testing of pull-up and pull-down resistors, along with more precise fault detection. Within XJAnalyser, BSDL file auto-detection has been improved and the library of reusable JTAG scripts has been expanded. It is quicker to set up non-JTAG devices following enhancements to the Devscript utility for XJEase.
The Development System meets the need for testing tightly-packed PCBs populated with BG) and chip scale devices, which cannot be tested by traditional methods.
Designed to cut the cost and shorten the development cycle of electronic products, can test JTAG or non-JTAG devices. Can test a high proportion of a circuit including BGA and chip scale devices, SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs, microprocessors and other devices. Enables In-System Programming of FPGAs, CPLDs and Flash memories.
XJTAG, xjtag.com
“With the addition of the chain debugger to the XJTAG system, engineers now have an ‘out-of-the-box’ solution for debugging and testing boards populated with JTAG devices,” said Dominic Plunkett, CTO. “Design engineers can now debug and test their printed circuits in hours as opposed to days/weeks with other competitive systems.”
In addition to the chain debugger, the XJTAG Development System has other new features to speed up board design and prototype testing. The connection test now includes built-in testing of pull-up and pull-down resistors, along with more precise fault detection. Within XJAnalyser, BSDL file auto-detection has been improved and the library of reusable JTAG scripts has been expanded. It is quicker to set up non-JTAG devices following enhancements to the Devscript utility for XJEase.
The Development System meets the need for testing tightly-packed PCBs populated with BG) and chip scale devices, which cannot be tested by traditional methods.
Designed to cut the cost and shorten the development cycle of electronic products, can test JTAG or non-JTAG devices. Can test a high proportion of a circuit including BGA and chip scale devices, SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs, microprocessors and other devices. Enables In-System Programming of FPGAs, CPLDs and Flash memories.
XJTAG, xjtag.com
Data I/O announced support for the Renesas R8C/11 “Tiny” series of microcontrollers beginning with support for the R5F211 on Data I/O’s FlashCore programming systems.
The FlashCore family includes the FlashPAK desktop programmer, the ProLine RoadRunner for inline automated handling and programming (attaching directly to the SMT feeder) and the PS offline automated handler and programming systems.
Renesas Technology Corp., renesas.com
Data I/O Corp., dataio.com
The FlashCore family includes the FlashPAK desktop programmer, the ProLine RoadRunner for inline automated handling and programming (attaching directly to the SMT feeder) and the PS offline automated handler and programming systems.
The microcontrollers are targeted at multiple applications including automotive products, consumer products, PC/networking and industrial environments. Based on the M16C architecture, the series is small in size but optimized for embedded systems applications.
Renesas Technology Corp., renesas.com
Data I/O Corp., dataio.com
High Energy Pulse Discharge capacitors reportedly set new standards of low equivalent series inductance and high pulse discharge current. ESLs of 5 nanoHenrys and pulse discharge currents of 100,000 Amps have been achieved for a 100 KV 4.0 nanoFarad unit.
The capacitors combine the oldest known inorganic dielectric, MICA, with a proprietary manufacturing process based on low-out gassing PCB technology used at Fermi National Accelerator Laboratory.
Advantages include completely solid-state construction with no sealed containers to rupture or oil to leak. Form-factor is completely flexible; units can be custom made to thicknesses less than 1/2 cm for planar transmission line installation to a standard rectangular form factor to drop-in replace lower performance capacitors. Temperature rating is 150°C.
Available ranging from 0.1 to 100 nF and from 20,000 to 200,000 Volts.
Pentaplex Inc., pentaplexinc.com
