The Di-Series family of C‑size VXI-based digital test instruments builds upon the M9‑Series by increasing performance and adding key new features for emerging applications. Features highly configurable, independently programmed channels to address a test requirements from board through subassembly test.
Four key attributes: Compatibility with the M9-Series and other instruments is preserved ; Flexibility is well suited to the highest levels of assembly, such as box-level LRU (Line Replaceable Units) or WRA (Weapons Replaceable Assemblies). In addition, Di-Series cards can be partitioned to form multiple autonomous “virtual” instruments, each of which can simultaneously address different portions of the test problem while interacting with the UUT; Performance enhancements include the ability to directly test differential logic, including high-speed LVDS (Low Voltage Differential Signaling). Usability is enhanced by the per-channel programming of signal timing and levels and by iStudio development and debugging software. Teradyne, teradyne.com
Series 7000 Adaptable Workbench System for electronic test and repair applications offers flexibility to accommodate changing and future needs. Is certified cleanroom compliant. Can be tailored to suit the requirements of both the user and the application.
Available as a stationary and mobile workbench, can be configured with legs or cabinet pedestals. Users can custom configure their bench by adding a Vertical Space Integrator which can service one or two benches in a back-to-back configuration. Accessories include storage, shelving, lights, power beams and more. The power beam is offered in single- and double-sided configurations; each side has eight receptacles, a lighted power switch, and a 15 or 20 amp breaker.
Available with a dove-gray static dissipative laminate worksurface with a grounding kit. Other worksurface options include plastic laminate, butcher block, stainless steel and satin coat steel.
Cabinet drawers provide storage for parts, tools, components and accessories. A selection of dividing and partitioning accessories for drawer interiors is available.
Can support 1000 lbs. (454 kg), evenly distributed.
Goepel electronic has developed a boundary scan option for the Digitaltest In-Circuit Tester series MTS 180, MTS 300 and MTS 888. The solution integrates the recently launched hardware architecture Scanflex in combination with the boundary scan system software Cascon Galaxy, and also involves the ICT digital pin electronics.
“The result of the development cooperation is a completely integrated solution with interaction of the test resources of both systems,” said Bettina Becker, marketing and international sales manager for Goepel. “In particular, the direct control of the ICT pin electronics by the Boundary Scan environment has the advantage of each nail acting as additional virtual scan pin in a Boundary Scan test. Applying our philosophy of ‘Extended Boundary Scan’, the user now is able to dramatically increase the test coverage.”
The hardware is based on the Scanflex PCI controller models SFX/PCI1149-x with programmable TCK frequencies up to 20 MHz (A type) and 50 MHz (B type), respectively. The connection to the UUT uses transceiver model SFX-TAP4/C, which provides four programmable TAP for the optimal adaptation to the UUT. The UUT is contacted by means of the standard interface of the ICT. Also, 32 dynamic I/O are available on the hardware.
In terms of software, the complete Cascon Galaxy development and execution environment was integrated into the CITE operating system by Digitaltest via the CAPI interface. All Cascon software editions can run on the ICT.
The ICT pin electronics' control is managed with Hyscan technology implemented in the software. It enables the synchronisation of serial JTAG/Boundary Scan test vectors with parallel test vectors through a special emulation process. The parallel vectors are linked to the physical I/O interface at run time, providing tester hardware independence. The manual or automated generation of test vectors, debugging and fault diagnostic are executed by the native JTAG/Boundary Scan tools, whereby each ICT channel acts as a bi-directional Boundary Scan pin at the contacted net, completely transparent to the user.