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Mike Buetow

CAVEAT LECTOR

Change for the better.

Mike Buetow
Peter Bigelow

ROI

Driven by data.

Peter Bigelow
E Jan Vardaman

On the Forefront

Nepcon Japan: Embedded RF and 5G.

E. Jan Vardaman
Filemon SagreroJuan Jose Morales Ibarra

GETTING LEAN

Mistake-proofing the line.

Juan Jose Morales Ibarra and
Filemon Sagrero Quirino
 
David Bernard

TEST AND INSPECTION

Voiding in QFPs.

David Bernard, Ph.D.
Robert Boguski

TEST AND INSPECTION

Can data be dumb?

Robert Boguski
Bob Willis

DEFECTS DATABASE

Post-rework underfill expansion.

Bob Willis

 
 
Mike Buetow

CAVEAT LECTOR

2001 revisited.
Mike Buetow
Peter Bigelow

ROI

Is automotive our new high-rel driver?

Peter Bigelow
Sue Mucha 

FOCUS ON BUSINESS

EMS program management goes online.
Susan Mucha
 

TECH TIPS

Reworking conformal coatings.
Vlad David
Clive Ashmore

SCREEN PRINTING

Should finer solder particle sizes result in better process results?
Clive Ashmore
David Bernard 

TEST AND INSPECTION

Use partial CT to reveal trace discontinuities at incoming inspection.
David Bernard, Ph.D.
Martin Wickham

DEFECTS DATABASE

Improper reflow profiles.
Martin Wickham
   
Mike Buetow

CAVEAT LECTOR

Getting back to the start of the roadmap.

Mike Buetow
Peter Bigelow

ROI

Is there more to good fortune than just fate?

Peter Bigelow
Ranko Vujosevic

The SMART FACTORY

Why most MES implementations in electronics manufacturing fail.

Ranko Vujosevic, Ph.D.
David Bernard

TEST AND INSPECTION

Voiding under QFN central terminations.

David Bernard, Ph.D.
Robert Boguski

TEST AND INSPECTION

An ethical dilemma (for some).

Robert Boguski
Martin Wickham   

DEFECTS DATABASE

Voiding under QFN central terminations.

Martin Wickham
Dennis Mcnamara

GETTING LEAN

Configure-to-order production.

Dennis McNamara
   

KENTWOOD, MI -- Amphenol Borisch Technologies will invest a reported $3.7 million to renovate its headquarters here and expand its manufacturing operations.

Read more ...

InstrumentStudio Software for NI PXI modular instruments improves the live, interactive use model for modular instruments and makes debugging while running tests more intuitive.

Read more ...
Mike Buetow

CAVEAT LECTOR

The next generation.

Mike Buetow
Peter Bigelow

ROI

Risk distribution.

Peter Bigelow
E. Jan Vardaman

ON THE FOREFRONT

ECTC recap: HDI is the future.

E. Jan Vardaman
Mark Finstad

THE FLEXPERTS

High-speed flex design.

Mark Finstad
David Bernard

TEST AND INSPECTION

Transmissive and reflective targets.

David Bernard, Ph.D.
Robert Boguski

TEST AND INSPECTION

Conventional thinking.

Robert Boguski
Yousef Heidari

GETTING LEAN

Lean fixtures.

Yousef Heidari
Martin Wickham   

DEFECTS DATABASE

Is it the mask, or is it the gold-plating underneath?

Martin Wickham

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