Keithley Instruments announces two new additions to its Series 2600 System SourceMeter instruments. Models 2611 and 2612 add higher voltage and higher current capabilities to the source-measure unit (SMU) platform. The 200V and 10A capabilities of the two new models make them ideal for functional test and I-V characterization of silicon and compound semiconductor devices like FETs, diodes, voltage regulators and optoelectronic components. Combine high throughput SMU technology with a compact, scalable form factor that allows integration into systems from one to 16 SMU channels.
 
Designed to rapidly test low to medium pin count devices or multiple devices in a production test fixture. Model 2611 is a single-channel SMU, and the Model 2612 is a dual-channel unit. Multiple units can be integrated with an embedded Test Script Processor (TSP) and TSP-Link. Users cam execute high-speed, automated test sequences across multiple channels, independent of a PC operating system and its associated communication delays. This allows test speeds up to ten times faster than conventional test instruments. With two channels and a 200V source range, Model 2612 is capable of 400V differential operation, and each SMU channel is capable of 1.5A DC and 10A pulsed output. Both models have a new contact check feature that eliminates false failures in high-speed test applications by ensuring that all connections to the devices under test are intact before a source-measure sequence is initiated.
 
Keithley Instruments, keithley.com

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