SwifTest-AQ ("Active Quality") software features real-time parts average testing (PAT) capabilities, designed to enable IC manufacturers to meet increasing safety standards and specifications for automotive electronics.

Performs PAT in real-time by calculating PAT limits from baseline data and binning out PAT outliers in real time, avoiding post-processing and subsequent delays in wafer processing.

Industry guidelines for semiconductor quality and reliability have been developed by the Automotive Electronics Council (AEC) to meet increasing safety standards for automotive electronic devices that drive the zero-defect goal for electronic parts.

Meets AEC-Q001 Part Average Testing standards during both wafer probe and final test. The AEC guideline presents a statistically based method for removing parts with abnormal characteristics— those parts that historically contribute significantly to

quality and reliability problems.

Jeff Bibbee, founder and CTO of Pintail Technologies, said, "Instead of post-processing large data files from all testers before calculating the PAT limits from the entire dataset for each test, SwifTest-AQ customers can increase quality dynamically, in real-time, and avoid delays in downstream manufacturing while also optimizing test time and capacity."

www.pintail.com

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