Products
Pressure Decay Leak Test Calculator is automated and generates nearly instantaneous answers to “what if” modeling of pressure decay leak testing variables from 8-sensor concurrent leak testing technology. Variables that can be manipulated include pressure ranges; leak rate target; number of concurrent pressure decay sensors in use (up to 8 with Optima vT leak and flow tester); customization of test cycle times, including all stages of fill, stabilization, test time, and total, and part/test volume.
USON, Calculators@uson.com
535-10M UV cured epoxy is formulated for disk drive, camera module, optoelectronics and circuit assembly applications. Non-conductive adhesive cures rapidly when exposed to high-intensity UV light. Is low outgassing, flexible, high-strength; does not contain antimony.
Engineered Material Systems, www.conductives.com
Shrouded male pin connectors are for frequently mated interconnects and blind mate conditions. Double row connectors come in 4- to 64-pin configurations, in through-hole and surface mount termination styles. Shroud extends above pins to limit misalignment between connectors during mating and de-mating. PTH and SMT versions are dual-row with 0.100" spacing pin-to-pin and row-to-row. Connector body is molded from high-temperature thermoplastic with thermal stability, chemical resistance and flammability rating of UL94 V-0. Pins are made from precision-machined brass. Engaging leads are 0.030" in diameter, 0.142" long and gold-plated. Are RoHS compliant and suitable for Pb-free reflow.
Mill-Max, www.mill-max.com
Press Releases
- SEMI Applauds Statement from Senators Crapo and Wyden Supporting U.S. Tax Credit for Semiconductor Manufacturing
- ECIA’s July Industry Pulse Sentiment Index Suffers Summer Slide and Dips 12.5 Points from June High
- Datest to Host Siemens EDA Webinar on Data-Driven PCB Test Planning for Increasingly Complex Electronics Designs
- StenTech Expands North American Manufacturing Capacity Through Strategic Investment