XM8000 wafer x-ray metrology platform reveals optically hidden and visible features of TSVs, 2.5D and 3D IC packages, MEMS and wafer bumps. Provides
nondestructive, inline wafer measurement of voiding and fill levels, overlay and critical dimensions.
Nordson DAGE, www.nordsondage.com
Spherolyte RDL / Pillar 2 process for high-speed plating of copper pillars and redistribution layers (RDLs) is a sulfuric acid-based three additive copper electrolyte system. Nonuniformity value – within wafer, die or/and profile – of the deposited copper structures, even over a range of applied current densities, is up to 17.5 ASD (3.9 µm/min). Process control is analyzable through an online system for all additives. Is for flip-chip applications for various sizes of copper pillars (including µ-Pillars), especially for handhelds such as tablets or smartphones.
Atotech, atotech.com
Kapton SMT plastic film stencils reportedly permit clean and precise hole patterns. Come in 4, 5 and 6 mil thicknesses. Present flat coplanar printing surfaces for solder paste printing. Are designed for prototype assembly, and the pitch of the components is one or above. Absorb heat of laser-cutting process without producing ridges.
BEST Inc., www.solder.net