EA1400 XRF uses detection technology coupled with x-ray optics designed for rapid screening of RoHS substances.

Screens materials for RoHS testing in production environments. Allows updates to substance control criteria as directives change. Silicon drift detector design reportedly improves accuracy and analysis speed for substances such as cadmium and lead. X-ray irradiation method provides more reproducible analysis of uneven and irregular surfaces. Boosts count rate for improved precision of trace elements. Software visually flags defined elements out of preset concentration limits. Automatically stops analysis once defined parameters are met. Pass/fail determination can be made before defined measurement time. Capable of distinguishing between main components in slag (Si, Ca, Al and Mg), polymers, minerals, chemicals and other materials.

EA1400 front2

Hitachi High-Tech

PCB West Virtual 2020 has more than 125 hours’ worth of technical sessions on printed circuit design and manufacturing available through Oct. 12. 


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