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X7056 simultaneously performs inline AOI and x-ray inspection. Detects concealed defects and can be used for on-demand verification. X-ray unit can be used to selectively verify individual defects during inspection tasks that primarily require an AOI with high throughput. Can use x-ray inspection for nonwettable stamped edges with QFPs. Inspects BTCs such as QFNs, and can be employed for balancing.

Viscom, www.viscom.com

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