Medalist i1000D in-circuit tester has digital test capabilities. Offers per pin programmability; digital PCF/VCL library-based testing; native boundary scan capabilities; I2C/SPI serial programming; simple, low-cost long-wired test fixture; and a flexible, easy-to-use GUI.

Comes with full native boundary scan test capabilities and VTEP v2.0 Powered vectorless test suite, including Cover-Extend.

Agilent Technologies, www.agilent.com 

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