English Edition of New Embedded Standard Now Available
Published: 17 June 2011
by Mike Buetow
MAASTRICHT, NETHERLANDS -- A European trade group has translated a new JPCA standard for designing and testing embedded devices.
JPCA-EB01, Standard on Device Embedded Substrate, 4th edition, was released at earlier this month. The 200-page document covers terminology, reliability, test and design options for embedded devices, including base devices; mounting and interconnections; fabrication; test specimens and methodology, microsectioning; conductor dimensions; environmental tests and more.
The EPIC is distributing the English version of the document at eipc.org.
