EHS-222M-L highly accelerated stress test chamber supports reliability testing of large multilayer PCBs and high-density electronic assemblies. Accommodates board sizes up to 290×460mm with increased internal depth and expanded fixture capacity for high specimen volumes. Provides up to 120 bias terminals at up to 1,000V to support complex testing configurations. Operates across temperature range of +105.0°C to +142.9°C, humidity range of 75%–100%RH and pressure range of 0.019–0.193MPa. Supports accelerated reliability testing for AI hardware, automotive electronics and data center systems requiring high-temperature, high-humidity and pressure conditions.

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