Keysight Launches High Density In-Circuit Test System
Keysight Technologies' i3070 Series 7i in-line test system is an automated in-circuit test system that offers increased capacity and throughput to meet the complex test demands of larger node count PCBAs.
Provides manufacturers an automated testing process that substantially reduces overall test time and increases capacity up to 5760 nodes on a slim in-line footprint to meet complex testing requirements and enable the processing of larger panels. Uses an Enhanced Shorts Test algorithm consisting of two phases – a detection phase and an isolation phase – making the testing procedure 50% faster compared to traditional methods. Enables the testing of supercapacitors up to 100 Farads through an available integration solution that eliminates the need for individual fixture electronics, and resolves issues often associated with long-wire fixturing, like noise that affects test stability.
Keysight Technologies
