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Written by Administrator
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Thursday, 30 June 2005 19:00 |
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FEATURES
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Process Improvement Reducing BGA Defects with AXI Inspection How large can a BGA void be and still be considered acceptable? This study established the ideal sensitivity setting for catching BGA voids. Zhen (Jane) Feng, Ph.D., Eduardo Toledo, Jonathan Jian and Murad Kurwa
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ROHS Compliance RoHS and the Supply Chain The time is at hand to switch to lead-free parts. What are the issues involved? Chris Reynolds
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IC Testing The Basics of Boundary Scan Eliminate ICT and functional test while reusing test data. Stefan Meissner
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Ag Solderability Wetting Characteristics of Pb-Free Alloys of Interest Regardless of flux, silver-containing alloys can achieve acceptable wetting at high temperatures. Anna Lifton, Ronald A. Bulwith and Louis M. Picchione
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Cover Story Stencil Design for Pb-Free SMT Assembly The new process will require a few tweaks from SnPb standards. Chrys Shea
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Optical Inspection Pb-Free Flip Chip and CSP Inspection A review of failure analysis data for area arrays used in Pb-free soldering shows topside ball delamination that x-ray alone cannot detect. A new nondestructive optical inspection technology can, however. Mark Cannon and Juergen Friedrich
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On the cover: "Homeplate" apertures will be replaced by a variety of new designs. (David Gilder)
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Last Updated on Saturday, 13 October 2012 08:10 |