| Aster Updates TestWay Design Validation Tool |
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| Written by Chelsey Drysdale | |||
| Monday, 28 January 2013 11:37 | |||
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TestWay software assesses defect opportunities and identifies possible consequences of inadequate testability and test coverage on a new design. Analyzes each stage of the design-to-delivery workflow. Checks ROHS, reliability, DPMO, BSDL file validation to guide component selection. Verifies electrical DfT guidelines. Includes standard checks and customer’s specific checks. Optimizes test probe placement according to test strategy definitions, estimates test coverage, models the cost, and calculates production yield and TL9000 initial return rates. Estimates test coverage using theoretical models for a range of test and inspection strategies. Exports CAD data into native format usable by assembly machines, AOI, automated x-ray, in-circuit testers, flying probe testers and boundary scan testers. Can read completed test program or test report and compare the coverage between the estimated and measured analysis.
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Columns
| Semblant Warms to New Fluoropolymer Conformal Coating |
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Months after hinting at a new conformal coating during a paper session at SMTA International, Semblant has officially launched PlasmaShield. CIRCUITS ASSEMBLY editor in chief Mike Buetow spoke with vice president of worldwide sales and marketing Steve McClure last week. |
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| ECTC in Las Vegas |
What happens in Las Vegas at ECTC, doesn’t stay in Las Vegas, it is shared here. This year’s ECTC, or electronics components technology conference, was held in Las Vegas’ Cosmopolitan, May 28-31. |
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Features
| The Impact of Reel Splicing Kits on Setup and Changeover |
Traditional feeder setup using tape-and-reel can drain time. There’s a quick and better way. |
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| Standard Solar Cells vs. Next-Gen Cells: Which is Winning? |
Overcapacity is stalling the rate of improvement, but only for so long. |
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Products
Software release SI 7.46 reduces AOI inspection times through improved optimization of travel paths. Integrates Library Manager to assign new inspection patterns more quickly and easily, easing use...


