QM1000 has four sites for testing analog and mixed signal Mosfets, JFETs, IGBTs, diodes, mixed signal ICs, and discrete analog devices. Designed to mate with and expand the capabilities of the LTX-Credence ASL1000; performs DC and specialty AC tests, including QG, RG, CG, and UIL/UIS (Avalanche). Offers up to 4x improvement in test throughput and yield, and is compatible with film frame, rotary, and auto handlers.

BEST Electronics and Components Co. Inc., www.becci-usea.com/dev/bestnew/services/qm1000/  

MUST camera system, for MUST III solderability testers, enhances small component alignment and inspection. Provides high magnification and a precision view of part-to-solder alignment; enables monitoring of solderability testing process. Includes 1/3" CMOS color camera with 3.3x MP macro zoom lens. Features include up to 744 x 480 pixel resolution; up to 150 FPS; color to mono switching; and close-up viewing of micro components. Is retrofittable to any existing MUST system. Captures live images into various formats; captures a timed sequence of images at set intervals; zooms from 10% to 200%, rotates images, and enables AVI recording for a defined period.

GEN3 Systems, www.gen3systems.com

RED-E-SET XL series are large panel supports from 24" to 60". Are used in the ML and GO! models. Reportedly reduce changeover times, improve quality, and eliminate component damage.

Production Solutions, www.production-solutions.com

Two PXI5396-DT/x JTAG digital I/O modules on PXI bus basis support structural JTAG/boundary scan tests and I/O operations up to 100MHz for functional test executions. Feature impedance-controlled VPC interface for direct coupling to signal-critical load boards or other verification environments. Can use one test hardware for both laboratory verification and in the production line with fixture-based systems. Are based on a two-component solution, consisting of a PXI-supported interface module and an offset desktop module. Separation of the modules can be up to 2m without loss of performance. Desktop module is equipped with front connector that permits the module to be connected directly to the test environment. Two variants are available that differ in the on-board memory depth of 72MB with the PXI 5396-DT and 144MB with the PXI 5396-DT/XM. Both variants provide 96 single-ended channels, configurable as input, output and tri-state. Signals are processed synchronously to the test bus operations in the JTAG mode. Dynamic I/O mode permits functional testing with programmable clock rates within the range of 500Hz to 100MHz. Include VarioCore technology.

Goepel electronic, www.goepel.com